File:Stylus Instrument.svg
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[edit] Summary
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Deutsch: Prinzip eines Tastschnittgerätes (auch für die Erläuterung eines Rasterkraftmikroskopes geeignet): Ein Träger (1) hält eine kleine Spitze (2), die horizontal (3) über die Objektoberfläche (5) gezogen wird. Während die Spitze dem Profil folgt, bewegt sich der Ausleger vertikal (4). Die Vertikalposition wird als hellgrün dargestelltes Profil (6) aufgezeichnet.
English: Principle of a stylus instrument profilometer (also suitable for an atomic force microscope, AFM): A cantilever (1) is holding a small tip (2) that is sliding along the horizontal direction (3) over the object's surface (5). Following the profile the cantilever is moving vertically (4). The vertical position is recorded as the measured profile (6) shown in light green.
Français : Principe de fonctionnement d'un profilomètre de contact (le microscope à force atomique est basé sur un principe comparable). Un levier (1) porte une pointe (2) qui glisse horizontalement (3) le long de la surface à analyser (5). En fonction du profil parcouru, le levier est soumis à un mouvement vertical (4). Ce mouvement permet d'enregistrer le profil ainsi mesuré (6, en vert clair), avec un précision déterminée par la forme du stylet.
Русский: Консоль (1) держит иглу (2), которая перемещается горизонтально в направлении (3) над поверхностью объекта (5). Движение иглы повторяет основные неровности профиля и соответственно двигает консоль вертикально. Вертикальная позиция (4) записывается как измеренный профиль поверхности (6)(светло-зелёная линия).
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| Date | 10 August 2008 |
| Source | Own work |
| Author | Dr. Schorsch |
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This image has been assessed under the valued image criteria and is considered the most valued image on Commons within the scope: Principle of a tactile profilometer. You can see its nomination at Commons:Valued image candidates/Stylus Instrument.svg.
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This image has been assessed using the Quality image guidelines and is considered a Quality image.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 09:29, 8 August 2008 | | 554 × 318 (23 KB) | Xorx | {{Information |Description={{en|1=Principle of a stylus instrument profilometer (also suitable for an atomic force microscope, AFM): A cantilever (1) is holding a small tip (2) that is sliding along the horizontal direction (3) over the object's surface ( |
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