Orthogonal Defect Classification
Orthogonal Defect Classification (ODC)  turns semantic information in the software defect stream into a measurement on the process. The ideas were developed in the late '80s and early '90s at IBM Research by Ram Chillarege. This has led to the development of new analytical methods used for sophisticated software development and test process analysis. ODC is process model, language and domain-agnostic. Applications of ODC have been reported by several corporations on a variety of platforms and development processes, ranging from waterfall, spiral, gated, and agile  development processes.
- IBM Research: Orthogonal Defect Classification
- Chillarege Inc.: Software Engineering Optimization ODC
- Orthogonal Defect Classification-A Concept for In-Process Measurements, IEEE Transactions on Software Engineering, November 1992 (vol. 18 no. 11). http://www.computer.org/portal/web/csdl/doi/10.1109/32.177364
- IEEE Computer Society, 2002 Technical Achievement Award http://www.computer.org/portal/web/awards/chillarege
- Orthogonal Defect Classification (ODC) in Agile Development M. Jagia, S. Meena, IEEE ISSRE 2009 Supplemental Proceedings, Nov. 2009.
- Orthogonal Defect Classification: An Agile Test/QA Primer, Agile Development Conference, Nov. 2012
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