Orthogonal Defect Classification
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Orthogonal Defect Classification (ODC) [1] turns semantic information in the software defect stream into a measurement on the process. The ideas were developed in the late '80s and early '90s at IBM Research by Ram Chillarege.[2] This has led to the development of new analytical methods used for sophisticated software development and test process analysis. ODC is process model, language and domain-agnostic. Applications of ODC have been reported by several corporations on a variety of platforms and development processes, ranging from waterfall, spiral, gated, and agile [3] [4]development processes.
External links[edit]
- IBM Research: Orthogonal Defect Classification
- Chillarege Inc.: Software Engineering Optimization ODC
References[edit]
- ^ Orthogonal Defect Classification-A Concept for In-Process Measurements, IEEE Transactions on Software Engineering, November 1992 (vol. 18 no. 11). http://www.computer.org/portal/web/csdl/doi/10.1109/32.177364
- ^ IEEE Computer Society, 2002 Technical Achievement Award http://www.computer.org/portal/web/awards/chillarege
- ^ Orthogonal Defect Classification (ODC) in Agile Development M. Jagia, S. Meena, IEEE ISSRE 2009 Supplemental Proceedings, Nov. 2009.
- ^ Orthogonal Defect Classification: An Agile Test/QA Primer, Agile Development Conference, Nov. 2012
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