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  • Thumbnail for Convergent beam electron diffraction
    textbook for materials science (2nd ed.). New York: Springer. ISBN 978-0-387-76501-3. Steeds, John Wickham; Hren, J. J.; Goldstein, J. I.; Joy, D. C. (1979)...
    23 KB (2,702 words) - 15:12, 8 July 2024
  • Textbook for Materials Science. Springer, Boston, MA. doi:10.1007/978-0-387-76501-3. ISBN 978-0-387-76500-6. Fultz B, Howe JM (2013). Transmission Electron...
    26 KB (4,006 words) - 00:12, 27 August 2024
  • (2nd ed.). New York City: Springer Science+Business Media. p. 20. ISBN 9780387765013. Retrieved 5 May 2019. "Publications". International Society for Stereology...
    5 KB (386 words) - 16:41, 3 May 2024
  • (2nd ed.). New York City: Springer Science+Business Media. p. 20. ISBN 9780387765013. Retrieved 17 May 2017. "National and regional societies". European...
    4 KB (248 words) - 02:24, 16 December 2023
  • Thumbnail for Moiré pattern
    microscopy : a textbook for materials science. Springer. pp. 393–397. ISBN 9780387765013. OCLC 876600051. Heczko, M.; Esser, B.D.; Smith, T.M.; Beran, P.; Mazánová...
    35 KB (4,158 words) - 09:46, 30 August 2024
  • Thumbnail for Electron backscatter diffraction
    microscopy: a textbook for materials science. Plenum Press. p. 11. ISBN 978-0-387-76501-3. OCLC 633626308. Britton, T.B.; Jiang, J.; Clough, R.; Tarleton, E...
    124 KB (13,682 words) - 20:39, 19 July 2024