Category:Semiconductors

*

• ► Semiconductor physicists‎ (40 P)

A

• ► Semiconductor analysis‎ (38 P)

C

• ► Semiconductor companies‎ (31 C, 2 P)

D

• ► Semiconductor devices‎ (9 C, 44 P)

J

• ► Semiconductor journals‎ (8 P)

M

• ► Semiconductor materials‎ (9 C, 41 P, 1 F)

P

• ► Semiconductor packages‎ (1 C, 20 P)
• ► Semiconductor properties‎ (2 C, 9 P)

S

• ► Semiconductor structures‎ (26 P)

T

• ► Semiconductor technology‎ (1 C, 35 P)

• Semiconductor

A

• Acousto-electric effect
• Anomalous photovoltaic effect

C

• Channel (semiconductor)
• Current injection technique

D

• Weili Dai
• Deathnium
• Die shrink
• Diffusion capacitance
• Diffusion current
• Dresselhaus effect

E

• Electron mobility
• Electronics and semiconductor manufacturing industry in India
• Equivalent oxide thickness
• Etch pit density

F

• Field effect (semiconductor)
• Floating body effect
• Foundry model

G

• Glossary of microelectronics manufacturing terms

H

• Haynes–Shockley experiment
• High-temperature operating life
• Hot-carrier injection

I

• Impact ionization
• Isobutylgermane
• Isotropic etching

J

• Johnson's figure of merit
• Junction temperature

L

• Low-level injection
• Luttinger parameter

M

• Moisture sensitivity level
• Mott–Schottky plot

N

• Nanowire lasers
• Negative luminescence
• Non linear piezoelectric effects in polar semiconductors

O

• On-die termination
• Overdrive voltage

P

• Photo–Dember effect
• Photoelectrochemical process
• Proximity communication

R

• Random logic
• Rashba effect
• Rashba–Edelstein effect
• Refractive index and extinction coefficient of thin film materials
• Reverse leakage current
• Roll-to-roll processing
• Rubber diode

S

• Saturation velocity
• Sheet resistance
• Silver sulfide
• Single-layer materials
• Snapback (electrical)
• Solid-state electronics
• Space charge
• Spin gapless semiconductor
• Strain engineering
• Symposia on VLSI Technology and Circuits

T

• Thermal copper pillar bump
• Thin-film transistor
• Topological insulator
• Topological insulator growth
• Transistor channel
• Transmission line measurement
• Tunnel injection
• Two-dimensional semiconductor

U

• Ultrafast scanning electron microscopy

V

• Valleytronics
• Virtual Socket Interface Alliance
• Voltage reference