Nobukazu Teranishi (寺西 信一 Teranishi Nobukazu, born 1953) is a Japanese engineer who researches image sensors, and is known for inventing the pinned photodiode, a component of modern digital cameras. He was one of four recipients of the 2017 Queen Elizabeth Prize for Engineering. As of 2017, he is a professor at the University of Hyogo and at Shizuoka University.
Teranishi studied physics at the University of Tokyo. He joined NEC Corporation in 1978, where he invented the pinned photodiode in 1980; the device was named in 1984. The pinned photodiode is a development of the charge-coupled device (CCD) imager. It has improved efficiency compared with the CCD, resulting in reduced pixel size and higher image resolution. It remains an important component of digital camera technology. Teranishi continued to work for NEC Corporation until 2000, when he moved to Panasonic Corporation (until 2013). As of 2017, he is a professor at the University of Hyogo and at Shizuoka University in Japan.
Teranishi received the Queen Elizabeth Prize for Engineering in 2017, with Michael Tompsett, Eric Fossum and George Smith. His earlier awards include medals from the British Royal Photographic Society (2010) and the Photographic Society of America (2011), the Yamazaki Teiichi Award (2013) and the J.J. Ebers Award of the Institute of Electrical and Electronics Engineers (IEEE; 2013). He is a fellow of the IEEE.
- N. Teranishi, A. Kohono, Y. Ishihara, E. Oda, K. Arai (1982). No image lag photodiode structure in the interline CCD image sensor. Proc IEDM (Electron Devices Meeting, 1982 International, 13–15 December 1982): 324–27 doi:10.1109/IEDM.1982.190285
- Professor Nobukazu Teranishi, Queen Elizabeth Prize for Engineering, 1 February 2017, retrieved 3 February 2017
- Pallab Ghosh (1 February 2017), £1m Queen Elizabeth Prize: Digital camera tech lauded, BBC, retrieved 3 February 2017
- Samuel K. Moore (2 February 2017), Four IEEE Fellows Share Queen Elizabeth Prize for Digital Cameras, Institute of Electrical and Electronics Engineers, retrieved 3 February 2017
- J.J. Ebers Award, Institute of Electrical and Electronics Engineers, retrieved 3 February 2017
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