Selected ion monitoring

From Wikipedia, the free encyclopedia
Jump to: navigation, search

Selected ion monitoring (SIM) is a mass spectrometry scanning mode in which only a limited mass-to-charge ratio range is transmitted/detected by the instrument, as opposed to the full spectrum range.[1][2] This mode of operation typically results in significantly increased sensitivity. Due to their inherent nature, this technique is most effective—and therefore most common—on quadrupole mass spectrometers and Fourier transform ion cyclotron resonance mass spectrometers.

References[edit]

  1. ^ IUPAC, Compendium of Chemical Terminology, 2nd ed. (the "Gold Book") (1997). Online corrected version:  (2006–) "selected ion monitoring".
  2. ^ Murray, Kermit K.; Boyd, Robert K.; Eberlin, Marcos N.; Langley, G. John; Li, Liang; Naito, Yasuhide (2013). "Definitions of terms relating to mass spectrometry (IUPAC Recommendations 2013)". Pure and Applied Chemistry: 1. ISSN 0033-4545. doi:10.1351/PAC-REC-06-04-06.