Standard Test Data Format
Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others.
STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.
Standards developing organizations
- IEEE Test Technology Standards Group/Committee
- SEMI Collaborative Alliance for Semiconductor Test (CAST)
- C library for processing STDF related data
- Java library for processing STDF related data
- .NET library from reading and writing STDF files
- LabVIEW library for processing STDF related data
- Python module to process STDF files (only STDFv4 format)
- Python module to process STDF files (both STDFv3 and STDFv4 format)
- R based open source data analysis tool for STDF and other ATE formatted data
- Perl programs to manipulate STDF, ATDF, and XTDF files.
|This technology-related article is a stub. You can help Wikipedia by expanding it.|