Standard Test Data Format

From Wikipedia, the free encyclopedia
Jump to navigation Jump to search

Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as Cohu, Roos Instruments, Teradyne, Advantest, and others.

STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.


  • "yieldHUB".{{cite web}}: CS1 maint: url-status (link)

External links[edit]


Standards developing organizations[edit]

External libraries[edit]

Additional links[edit]