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===History===
===History===
The first STEM was built in 1938 by Baron [[Manfred von Ardenne]],<ref>{{cite journal
The first STEM was built in 1938 by Baron [[Manfred von Ardenne]],{{ref|vA1}}{{ref|vA2}} working in [[Berlin]] for [[Siemens AG|Siemens]]. However, the results were inferior to that of TEM at the time, and von Ardenne only spent two years working on the problem. The microscope was destroyed in an air raid in 1944, and von Ardenne did not return to the field after WWII.{{ref|vA3}}
|last=von Ardenne
|first=M
|year=1938
|title=Das Elektronen-Rastermikroskop. Theoretische Grundlagen
|journal=Z Phys
|volume=109
|pages=553–572}}</ref><ref>{{cite journal
|last=von Ardenne
|first=M
|year=1938
|title=Das Elektronen-Rastermikroskop. Praktische Ausführung
|journal=Z tech Phys
|volume=19
|pages=407–416}}</ref> working in [[Berlin]] for [[Siemens AG|Siemens]]. However, the results were inferior to that of TEM at the time, and von Ardenne only spent two years working on the problem. The microscope was destroyed in an air raid in 1944, and von Ardenne did not return to the field after WWII.<ref>[http://www-g.eng.cam.ac.uk/125/achievements/mcmullan/mcm.htm D. McMullan, SEM 1928 - 1965]</ref>


The technique did not become developed until the 1970s, with [[Albert Crewe]] at the [[University of Chicago]] developing the field emission gun{{ref|Crewe}} and adding a high quality objective lens to create the modern STEM, and demonstrated the ability to image atoms using ADF.
The technique did not become developed until the 1970s, with [[Albert Crewe]] at the [[University of Chicago]] developing the field emission gun<ref>{{cite journal
|last=Crewe
|first=Albert V
|coauthors=Isaacson, M. & Johnson, D.
|year=1969
|title=A Simple Scanning Electron Microscope
|journal=Rev. Sci. Inst.
|volume=40
|pages=241–246
|doi=10.1063/1.1683910}}</ref> and adding a high quality objective lens to create the modern STEM, and demonstrated the ability to image atoms using ADF.


Crewe and coworkers at the [[University of Chicago]] developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates (Crewe et al., 1970).{{ref|Crewe2}}
Crewe and coworkers at the [[University of Chicago]] developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates.<ref>{{cite journal
|last=Crewe
|first=Albert V
|coauthors=Wall, J. & Langmore, J.
|year=1970
|title=Visibility of a single atom
|journal=Science
|volume=168
|pages=1338–1340
|doi=10.1126/science.168.3937.1338
|pmid=17731040}}</ref>


Atomic resolution chemical analysis using the STEM was first reported in 1993.{{ref|Br1}}{{ref|Br2}}
Atomic resolution chemical analysis using the STEM was first reported in 1993.<ref>{{cite journal
|last=Browning
|first=N. D.
|coauthors=Chisholm M. F. & Pennycook S. J.
|date=November 11, 1993|title=Atomic-resolution chemical analysis using a scanning transmission electron microscope
|journal=Nature
|volume=366
|pages=143–146
|doi=10.1038/366143a0}}</ref><ref>{{cite journal
|last=Browning
|first=N. D.
|coauthors=Chisholm M. F. & Pennycook S. J.
|date=November 9, 2006|title=Corrigendum: Atomic-resolution chemical analysis using a scanning transmission electron microscope
|journal=Nature
|volume=444
|pages=235
|doi=10.1038/nature05262}}</ref>


===Biological Application===
===Biological Application===
The first application of this method to the imaging of biological molecules was demonstrated in 1971.<ref>Wall, J.S., 1971 "A high resolution scanning electron microscope for the study of single biological molecules" PhD thesis, University of Chicago</ref> The motivation for STEM imaging of biological samples is particularly to make use of dark-field microscopy, where the STEM is more efficient than a conventional TEM, allowing high contrast imaging of biological samples without requiring staining. The method has been widely used to solve a number of structural problems in molecular biology.<ref>{{cite journal|pmid=3521658}}</ref><ref>{{cite journal|pmid=3066333}}</ref><ref>{{cite journal|pmid=11357616}}</ref>
The first application of this method to the imaging of biological molecules was demonstrated soon thereafter (Wall, 1971). At Brookhaven National Laboratory, STEM1 was designed (and built) by Joe Wall.

The motivation for STEM imaging of biological samples is particularly to make use of dark-field microscopy, where the STEM is more efficient than a conventional TEM, allowing high contrast imaging of biological samples without requiring staining. The method has been widely used to solve a number of structural problems in molecular biology (Wall and Hainfeld, 1986; Hainfeld and Wall, 1988; Wall and Simon, 2001).
==References==
{{reflist|2}}


==See also==
==See also==
{{wikibooks|Nanotechnology|Electron_microscopy#Transmission_electron_microscopy_.28TEM.29|Transmission electron microscopy (TEM)}}
{{wikibooks|Nanotechnology|Electron_microscopy#Transmission_electron_microscopy_.28TEM.29|Transmission electron microscopy (TEM)}}
{{colbegin|2}}
*[[Electron beam induced deposition]]
*[[Electron beam induced deposition]]
*[[Electron diffraction]]
*[[Electron diffraction]]
Line 25: Line 77:
*[[Electron microscope]]
*[[Electron microscope]]
*[[Energy filtered transmission electron microscopy]] (EFTEM)
*[[Energy filtered transmission electron microscopy]] (EFTEM)
*[[high-resolution transmission electron microscopy]] (HRTEM)
*[[High-resolution transmission electron microscopy]] (HRTEM)
*[[Scanning confocal electron microscopy]]
*[[Scanning confocal electron microscopy]]
*[[Scanning electron microscope]] (SEM)
*[[Scanning electron microscope]] (SEM)
*[[Scanning transmission electron microscope]] (STEM)
*[[Scanning transmission electron microscope]] (STEM)
*[[Transmission Electron Aberration-corrected Microscope]]
*[[Transmission Electron Aberration-corrected Microscope]]
{{colend}}
* [http://people.ccmr.cornell.edu/~davidm/WEELS/index.html WEELS - Websource for Electron Energy Loss Spectra]
* [http://people.ccmr.cornell.edu/~davidm/useful/Optimizing%20your%20STEM.html Optimizing Your Microscope]
* [http://people.ccmr.cornell.edu/~davidm/Muller_tutorials.html Kavli Summer School on Electron Microscopy 2006: Fundamental Limits and New Science held at Cornell University, July 13-15, 2006.]
* [http://www.biology.bnl.gov/stem/stem.html Brookhaven STEM facility]


==References==
==External links==
*[http://people.ccmr.cornell.edu/~davidm/WEELS/index.html WEELS - Websource for Electron Energy Loss Spectra]
#{{note|vA1}} {{cite journal
*[http://people.ccmr.cornell.edu/~davidm/useful/Optimizing%20your%20STEM.html Optimizing Your Microscope]
| last = von Ardenne
*[http://people.ccmr.cornell.edu/~davidm/Muller_tutorials.html Kavli Summer School on Electron Microscopy 2006: Fundamental Limits and New Science held at Cornell University, July 13-15, 2006.]
| first = M
*[http://www.biology.bnl.gov/stem/stem.html Brookhaven STEM facility]
| year = 1938
*[http://www.nanoprobes.com/Jim.html James F. Hainfeld]
| month =
| title = Das Elektronen-Rastermikroskop. Theoretische Grundlagen
| journal = Z Phys
| volume = 109
| pages = 553–572
}}
#{{note|vA2}} {{cite journal
| last = von Ardenne
| first = M
| year = 1938
| title = Das Elektronen-Rastermikroskop. Praktische Ausführung
| journal = Z tech Phys
| volume = 19
| pages = 407–416
}}
#{{note|vA3}} [http://www-g.eng.cam.ac.uk/125/achievements/mcmullan/mcm.htm D. McMullan, SEM 1928 - 1965]
#{{note|Crewe}} {{cite journal
| last = Crewe
| first = Albert V
| coauthors = Isaacson, M. & Johnson, D.
| year = 1969
| title = A Simple Scanning Electron Microscope
| journal = Rev. Sci. Inst.
| volume = 40
| pages = 241–246
| doi = 10.1063/1.1683910
}}
#{{note|Crewe2}} {{cite journal
| last = Crewe
| first = Albert V
| coauthors = Wall, J. & Langmore, J.
| year = 1970
| title = Visibility of a single atom
| journal = Science
| volume = 168
| pages = 1338–1340
| doi = 10.1126/science.168.3937.1338
| pmid = 17731040
}}
#{{note|Br1}}{{cite journal
| last = Browning
| first = N. D.
| coauthors = Chisholm M. F. & Pennycook S. J.
| date = November 11, 1993 | title = Atomic-resolution chemical analysis using a scanning transmission electron microscope
| journal = Nature
| volume = 366
| pages = 143–146
| doi = 10.1038/366143a0
| url = http://www.nature.com/nature/journal/v366/n6451/abs/366143a0.html
}}
#{{note|Br2}}{{cite journal
| last = Browning
| first = N. D.
| authorlink =
| coauthors = Chisholm M. F. & Pennycook S. J.
| date = November 9, 2006 | title = Corrigendum: Atomic-resolution chemical analysis using a scanning transmission electron microscope
| journal = Nature
| volume = 444
| pages = 235
| doi = 10.1038/nature05262
| url = http://www.nature.com/nature/journal/v444/n7116/full/nature05262.html
}}


[[Category:Microscopes]]
[[Category:Microscopes]]
[[Category:Scientific techniques]]
[[Category:Electron microscopy]]


{{Sci-stub}}


[[de:Raster-Transmissionselektronenmikroskop]]
[[de:Raster-Transmissionselektronenmikroskop]]

Revision as of 10:10, 25 August 2009

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope. With it, the electrons pass through the specimen, but, as in scanning electron microscopy, the electron optics focus the beam into a narrow spot which is scanned over the sample in a raster.

The rastering of the beam across the sample makes these microscopes suitable for analysis techniques such as mapping by energy dispersive X-ray (EDX) spectroscopy, electron energy loss spectroscopy (EELS) and annular dark-field imaging (ADF). These signals can be obtained simultaneously, allowing direct correlation of image and quantitative data.

By using a STEM and a high-angle detector, it is possible to form atomic resolution images where the contrast is directly related to the atomic number. This is in contrast to the conventional high resolution electron microscopy technique, which uses phase-contrast, and therefore produces results which need interpretation by simulation.

History

The first STEM was built in 1938 by Baron Manfred von Ardenne,[1][2] working in Berlin for Siemens. However, the results were inferior to that of TEM at the time, and von Ardenne only spent two years working on the problem. The microscope was destroyed in an air raid in 1944, and von Ardenne did not return to the field after WWII.[3]

The technique did not become developed until the 1970s, with Albert Crewe at the University of Chicago developing the field emission gun[4] and adding a high quality objective lens to create the modern STEM, and demonstrated the ability to image atoms using ADF.

Crewe and coworkers at the University of Chicago developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates.[5]

Atomic resolution chemical analysis using the STEM was first reported in 1993.[6][7]

Biological Application

The first application of this method to the imaging of biological molecules was demonstrated in 1971.[8] The motivation for STEM imaging of biological samples is particularly to make use of dark-field microscopy, where the STEM is more efficient than a conventional TEM, allowing high contrast imaging of biological samples without requiring staining. The method has been widely used to solve a number of structural problems in molecular biology.[9][10][11]

References

  1. ^ von Ardenne, M (1938). "Das Elektronen-Rastermikroskop. Theoretische Grundlagen". Z Phys. 109: 553–572.
  2. ^ von Ardenne, M (1938). "Das Elektronen-Rastermikroskop. Praktische Ausführung". Z tech Phys. 19: 407–416.
  3. ^ D. McMullan, SEM 1928 - 1965
  4. ^ Crewe, Albert V (1969). "A Simple Scanning Electron Microscope". Rev. Sci. Inst. 40: 241–246. doi:10.1063/1.1683910. {{cite journal}}: Unknown parameter |coauthors= ignored (|author= suggested) (help)
  5. ^ Crewe, Albert V (1970). "Visibility of a single atom". Science. 168: 1338–1340. doi:10.1126/science.168.3937.1338. PMID 17731040. {{cite journal}}: Unknown parameter |coauthors= ignored (|author= suggested) (help)
  6. ^ Browning, N. D. (November 11, 1993). "Atomic-resolution chemical analysis using a scanning transmission electron microscope". Nature. 366: 143–146. doi:10.1038/366143a0. {{cite journal}}: Unknown parameter |coauthors= ignored (|author= suggested) (help)
  7. ^ Browning, N. D. (November 9, 2006). "Corrigendum: Atomic-resolution chemical analysis using a scanning transmission electron microscope". Nature. 444: 235. doi:10.1038/nature05262. {{cite journal}}: Unknown parameter |coauthors= ignored (|author= suggested) (help)
  8. ^ Wall, J.S., 1971 "A high resolution scanning electron microscope for the study of single biological molecules" PhD thesis, University of Chicago
  9. ^ . PMID 3521658. {{cite journal}}: Cite journal requires |journal= (help); Missing or empty |title= (help)
  10. ^ . PMID 3066333. {{cite journal}}: Cite journal requires |journal= (help); Missing or empty |title= (help)
  11. ^ . PMID 11357616. {{cite journal}}: Cite journal requires |journal= (help); Missing or empty |title= (help)

See also

The Wikibook Nanotechnology has a page on the topic of: Transmission electron microscopy (TEM)
Retrieved from "https://en.wikipedia.org/w/index.php?title=Scanning_transmission_electron_microscopy&oldid=309947924"