Ronchigram: Difference between revisions

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Ronchigram is the convergent beam diffraction pattern ^[1] of a known object with features comparable to the diffracting wavelength. In the case of electron Ronchigrams amorphous materials are used. The structure of the Ronchigram encodes information about the aberration phase field across the objective aperture^[2]. As such, Ronchigrams have become increasingly important with the invention of aberration corrected scanning transmission electron microscopy.

References

^ Kossel, W.; Möllenstedt, G. (1939). "Elektroneninterferenzen im konvergenten Bündel". Annalen der Physik (in German). 428 (2). Wiley: 113–140. doi:10.1002/andp.19394280204. ISSN 0003-3804.
^ Kirkland, Earl J. (2010). Advanced Computing in Electron Microscopy. Boston, MA: Springer US. doi:10.1007/978-1-4419-6533-2. ISBN 978-1-4419-6532-5.

External links

ronchigram.com Web simulator for generating Ronchigrams.

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[Kossel-1] Kossel, W.; Möllenstedt, G. (1939). "Elektroneninterferenzen im konvergenten Bündel". Annalen der Physik (in German). 428 (2). Wiley: 113–140. doi:10.1002/andp.19394280204. ISSN 0003-3804.

[Kirkland-2] Kirkland, Earl J. (2010). Advanced Computing in Electron Microscopy. Boston, MA: Springer US. doi:10.1007/978-1-4419-6533-2. ISBN 978-1-4419-6532-5.

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-'''Ronchigram''' is the convergent beam [[diffraction pattern]] <ref name ="Kossel">{{cite journal|title=Elektroneninterferenzen im konvergenten Bündel|author = W. Kossel  G. Möllenstedt| year = 1939}}</ref> of a known object with features comparable to the diffracting wavelength. In the case of electron Ronchigrams [[amorphous]] materials are used. The structure of the Ronchigram encodes information about the aberration phase field across the objective aperture<ref name ="Kirkland">{{cite book|title=Advanced Computing in Electron Microscopy|author = Dr. Earl J. Kirkland}}</ref>. As such, Ronchigrams have become increasingly important with the invention of aberration corrected [[scanning transmission electron microscopy]].
+'''Ronchigram''' is the convergent beam [[diffraction pattern]] <ref name ="Kossel">{{cite journal | last=Kossel | first=W. | last2=Möllenstedt | first2=G. | title=Elektroneninterferenzen im konvergenten Bündel | journal=Annalen der Physik | publisher=Wiley | volume=428 | issue=2 | year=1939 | issn=0003-3804 | doi=10.1002/andp.19394280204 | pages=113–140 | language=de}}</ref> of a known object with features comparable to the diffracting wavelength. In the case of electron Ronchigrams [[amorphous]] materials are used. The structure of the Ronchigram encodes information about the aberration phase field across the objective aperture<ref name ="Kirkland">{{cite book | last=Kirkland | first=Earl J. | title=Advanced Computing in Electron Microscopy | publisher=Springer US | publication-place=Boston, MA | year=2010 | isbn=978-1-4419-6532-5 | doi=10.1007/978-1-4419-6533-2}}</ref>. As such, Ronchigrams have become increasingly important with the invention of aberration corrected [[scanning transmission electron microscopy]].
 ==References==