Mehdi Vaez-Iravani

Mehdi Vaez-Iravani is an Iranian scientist,^[1] engineer and inventor involved in the invention of Shear-force microscopy.^[2]

Mehdi Vaez-Iravani graduated with a PhD in Electrical engineering from University College London and become faculy member at Rochester Institute of Technology before joining KLA Tencor.

He has numerous patents and scientific publications in optics, optical engineering and related areas. He attended Alborz High School in Tehran, Iran from 1971 to 1975.

Selected Bibliography

Vaez-Iravani, Mehdi, ed. (30 March 1995). Scanning Probe Microscopies III (Proceedings Volume). Scanning Probe Microscopies III. Vol. 2384. Bellingham, WA, USA: International Society for Optics and Photonics (SPIE). ISBN 978-0-8194-1731-2. OCLC 57388570. {{cite conference}}: Cite has empty unknown parameter: |conferenceurl= (help)
Vaez-Iravani, Mehdi; Toledo-Crow, Ricardo; Ade, Harald; et al. (30 Mar 1995). Near-field microscopy of thin films: application to polymeric structures. Scanning Probe Microscopies III. Vol. 2384. Bellingham, WA, USA: International Society for Optics and Photonics (SPIE). p. 166. doi:10.1117/12.205926. ISSN 0361-0748. OCLC 201621977. {{cite conference}}: External link in |conferenceurl= (help); Unknown parameter |conferenceurl= ignored (|conference-url= suggested) (help)
Toledo-Crow, Ricardo; Smith, Bruce W.; Rogers, Jon K.; Vaez-Iravani, Mehdi (1 May 1994). Bennett, Marylyn H (ed.). Near-field optical microscopy characterization of IC metrology (Proceedings Paper). Integrated Circuit Metrology, Inspection, and Process Control VIII. Vol. 2196. Bellingham, WA, USA: International Society for Optics and Photonics (SPIE). p. 62. doi:10.1117/12.174165. ISSN 0361-0748. OCLC 703607580. {{cite conference}}: External link in |conferenceurl= (help); Unknown parameter |conferenceurl= ignored (|conference-url= suggested) (help)
Toledo-Crow, Ricardo; Vaez-Iravani, Mehdi; Smith, Bruce W.; Summa, Joseph R. (4 August 1993). Postek, Michael T. (ed.). Characterization of atomic force microscopy and electrical probing techniques for IC metrology. Integrated Circuit Metrology, Inspection, and Process Control VII. Vol. 1926. Bellingham, WA, USA: International Society for Optics and Photonics (SPIE). pp. 357–368. doi:10.1117/12.148946. ISSN 0361-0748. OCLC 563909391. {{cite conference}}: External link in |conferenceurl= (help); Unknown parameter |conferenceurl= ignored (|conference-url= suggested) (help)
Vaez-Iravani, Mehdi; Nonnenmacher, M.; Wickramasinghe, H. Kumar (1 August 1993). "Detection of high- and low-frequency vibrations using a feedback-stabilized differential fiber optic interferometer". Optical Engineering. 32 (8). Bellingham, WA, USA: International Society for Optics and Photonics (SPIE): 1879–1882. doi:10.1117/12.143338. ISSN 0091-3286. OCLC 196617649.

References

^ Fillard, J. P. (January 1996). Near field optics and nanoscopy. World Scientific. pp. 359–362. ISBN 978-981-02-2349-6. Retrieved 2 April 2011.
^ Ducloy, M.; Bloch, Daniel (1996). Quantum optics of confined systems. Springer. p. 311. ISBN 978-0-7923-3974-8. Retrieved 2 April 2011.

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[Fillard1996-1] Fillard, J. P. (January 1996). Near field optics and nanoscopy. World Scientific. pp. 359–362. ISBN 978-981-02-2349-6. Retrieved 2 April 2011.

[DucloyBloch1996-2] Ducloy, M.; Bloch, Daniel (1996). Quantum optics of confined systems. Springer. p. 311. ISBN 978-0-7923-3974-8. Retrieved 2 April 2011.

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