Nanosensors (company): Difference between revisions
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Product type | Nanotechnology |
---|---|
Owner | NanoWorld |
Introduced | 1993 |
Markets | worldwide |
Tagline | The World Leader in Scanning Probes |
Website | nanosensors.com |
NANOSENSORS[1][2][3][4][5][6] is a brand of SPM and AFM probes for Atomic Force Microscopy and Scanning probe microscopy.
History
Basic research at IBM led to the development of the basic technologies necessary for batch processing of silicon SPM and AFM probes using bulk micromachining. In 1993 under the brand name NANOSENSORS they became the first commercialized SPM and AFM probes worldwide. In 2002, NANOSENSORS has been acquired by and integrated into Switzerland-based NanoWorld. It hase been continued as an independent business unit with its own well known trademark, marketing and its well established distribution channels.
Products
AFM Probe Series
PointProbePlus
The PointProbePlus series is directly based on the technology originally developed and commercialized by NANOSENSORS in 1993. The original PointProbe technology has been upgraded to the PointProbePlus technology in 2004 yielding a reduced and more reproducible tip radius compared to the original design. It is manufactured from highly doped monocrystalline silicon. The tip is pointing into the <100> crystal direction.
- PointProbePlus XY-Alignment Series & Alignment Chip
- PointProbePlus with gold
- PointProbePlus Silicon MFM Probe Series[7][8]
- SuperSharpSilicon[9][10]
- High Aspect Ratio AFM probes[11]
AdvancedTEC
The tip of the AdvancedTEC AFM probe series[12] protrudes from the end of the cantilever and is visible through the optical system of the Atomic force microscope. This visibility from the top allows the operator of the microscope to position the tip of this AFM probe at the point of interest.
- Akiyama-Probe[13]
Applications
- Non/Contact / Tapping Mode[14][15]
- Force Modulation Microscopy[16]
- Contact Mode[17]
- Electrostatic Force Modulation[18], Electrical measurement
- Magnetic Force Microscopy[19][20]
- Lateral Force Microscopy[21]
- Trench Measurement
- Nanoindentation[22][23]
- Self-sensing and self-actuating Akiyama-Probe (A-Probe) for dynamic mode atomic force microscopy (AFM)[24][25][26]
- Tipless cantilevers[27][28] for probe modification
Accessories
Awards
- 1995 Dr.-Rudolf-Eberle Innovation Award of the German State of Baden-Württemberg [31]
- 1995 Innovation Prize of the German Industry [32]
- 1999 Innovation Award of the Förderkreis für die Mikroelektronik e.V.[33]
References
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instead. - ^ Attention: This template ({{cite doi}}) is deprecated. To cite the publication identified by doi:10.1016/j.eurpolymj.2004.01.015, please use {{cite journal}} (if it was published in a bona fide academic journal, otherwise {{cite report}} with
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instead. - ^ Attention: This template ({{cite doi}}) is deprecated. To cite the publication identified by doi:10.1103/PhysRevB.79.214530, please use {{cite journal}} (if it was published in a bona fide academic journal, otherwise {{cite report}} with
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instead. - ^ Obrebski, J.W. (2010), Development of an Atomic Force Microscope (Master thesis)
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instead. - ^ Dr.-Rudolf-Eberle-Preis - Innovationspreis des Landes Baden Württemberg, Auszeichungen, Preisträger 1995
- ^ Innovationspreis der deutschen Wirtschaft, Erster Innovationspreis der Welt, Preisträger der Vorjahre, 1995
- ^ Annual Innovation Award of the Förderkreis Mikroelektronik, Industrie- und Handelskammer Nürnberg für Mittelfranken