Focus variation
Focus variation is a method to calculate a sharp image and to measure the depth with an optics with limited depth of field.
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[edit] Algorithm
The algorithm work as follows:
- at first images with difference focus are captured. This is done by moving the sample or the optics in relation to each other.
- then for each position the focus over each plane is calculated
- the plane with the best focus is used to get a sharp image. the corresponding depth gives the depth at this position-
[edit] Optics
Focus variation requires an optics with very little depth of field. This can be realized if a microscopy like optics and a microscope objective is used. These objectives have a high numerical aperture which gives a small depth of field.
[edit] Usage
The use of this method is for optical surface metrology and coordinate-measuring machine. This means measuring form, waviness and roughness on samples. With optimized hardware and software components a lateral resolution of 500 nm (limitation of wavelength of light) and a vertical resolution of several nm can be reached.
[edit] Advantages and Disadvantages
Advantages:
- can be used on samples with steep flankes. This is because a ring light can be used to extend the illumination aperture
- can deliver color information
- can measure on rough surfaces
Disadvantages:
- can not be used if the surface of the sample does not give structure in the image. This means it can not be used for wafers and glass
[edit] Standardisation
ISO committee is working on a new series of ISO standards that is called the ISO 25178 series. The part 6 document describes the available methods for roughness measurement. Focus variation is one of the described methods.
[edit] External links
- Roughness
- Surface metrology
- Alicona [1] . Manufacturer implementing focus variation into a product.
- [2] FOCUS VARIATION – A NEW TECHNOLOGY FOR HIGH RESOLUTION OPTICAL 3D SURFACE METROLOGY