User:Reimarspohr/Temp/Ion Track Technology/Characteristics
Task of ion track technology[edit]
Ion track technology can fill a niche where conventional microtechnology fails:
- Mask-less structuring is possible with random pattern governed by probability.[1]
- The technique is applicable to radiation resistant minerals, glasses and polymers.[2]
- The resolution limit of the structuring technique is smaller than 8 nanometers.[3]
- Thin polymer films can be structured directly without any development process.[4]
- Structural depth can be defined either by the film thickness or by the ion range.[5][6]
- Aspect ratios depend on material and processing and range between 1 and 104.[2]
- For narrow tracks it is possible to shape materials at defined cutting angle.[7]
- The angle of incidence offers two new degrees of freedom in shaping materials.[8]
Notes[edit]
- ^ C. Riedel, R. Spohr (1980). "Transmission Properties of Nuclear Track Filters". Journal of Membrane Science. 7: 225–234.
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(help) - ^ a b R.L. Fleischer, P.B. Price, R.M. Walker (1975). Nuclear tracks in solids. University of California Press. ISBN 0520026659.
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: CS1 maint: multiple names: authors list (link) - ^ W. D. Williams and N. Giordano (1984). "Fabrication of 80 Å metal wires". Review of Scientific Instruments. 55 (3): 410–412. Bibcode:1984RScI...55..410W. doi:10.1063/1.1137752.
- ^ Y. Eyal, K. Gassan (1999). "Observation of latent heavy-ion tracks in polyimide by means of transmission electron microscopy". Nuclear Instruments and Methods in Physics Research B. 156 (1–4): 183–190.
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(help) - ^ J.F. Ziegler (1980). Handbook of Stopping Cross-Sections for Energetic Ions in All Elements. Pergamon Press. ASIN 0080216072.
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value (help) - ^ Stopping and Range Calculation
- ^ M. Lindeberg, K. Hjort (2004). "A comprehensive study of ion track enabled high aspect ratio microstructures in flexible circuit boards". Microsystem Technologies. 10: 608–621.
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(help) - ^ R. Spohr, G. Sharma, P. Forsberg, M. Karlsson, A. Hallén, L. Westerberg (2010). "Stroke Asymmetry of Tilted Superhydrophobic Ion Track Textures". Langmuir. 26 (9): 6790–6796.
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(help)CS1 maint: multiple names: authors list (link)