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- An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used...22 KB (2,632 words) - 12:20, 31 July 2024
- Ion Mass spectrometers, electron Probe Microanalysis, Low-energy electron induced X-ray emission spectrometry, and atom Probe tomography. Rauland Healthcare...36 KB (1,881 words) - 06:05, 4 September 2024
- on two typical moldavite samples, followed by routine EPMA (Electron Probe Microanalysis), indicated agreement with EPMA studies and also revealed siderophile...12 KB (1,344 words) - 19:44, 21 August 2024
- Joy, D. C.; Fiori, C.; Lifshin, E. (1981). Scanning electron microscopy and x-ray microanalysis. New York: Plenum Press. ISBN 978-0-306-40768-0. Seligman...67 KB (8,141 words) - 10:21, 21 August 2024
- to Observe Small Biological Objects in Low-Voltage Electron Microscope". Microscopy and Microanalysis. 13 (3): 248–249. Bibcode:2007MiMic..13S.248N. doi:10...118 KB (15,058 words) - 07:02, 3 September 2024
- Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit". Microscopy and Microanalysis. 14 (5): 469–477. Bibcode:2008MiMic...37 KB (4,263 words) - 04:24, 27 December 2023
- et al. (2013). "Scanning Confocal Electron Energy-Loss Microscopy Using Valence-Loss Signals". Microscopy and Microanalysis. 19 (4): 1036–1049. Bibcode:2013MiMic...19 KB (2,262 words) - 17:09, 17 May 2024
- Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy". Microscopy and Microanalysis. 14 (S2): 804–805. Bibcode:2008MiMic..14S.804T. doi:10...12 KB (1,332 words) - 21:13, 10 May 2024
- been determined, using such techniques as scanning electron microscopy, electron probe microanalysis, or X-ray diffraction analysis, they have been found...12 KB (1,219 words) - 16:51, 25 April 2024
- nuclear double resonance, see ESR or EPR EPMA – Electron probe microanalysis EPR – Electron paramagnetic resonance spectroscopy ERD or ERDA – Elastic recoil...14 KB (1,389 words) - 13:16, 30 July 2024
- techniques for trace element concentrations such as field emission-electron probe microanalysis (FE-EPMA) and synchrotron micro X-ray fluorescence spectroscopy...7 KB (926 words) - 21:11, 8 February 2022
- Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond". Microscopy and Microanalysis. 25 (3): 563–582...40 KB (4,749 words) - 03:20, 9 June 2024
- the analysis of the X-ray spectra after electron bombardment (electron beam microanalysis, EPMA, Electron Probe Micro Analysis). In the late 1950s he was...9 KB (807 words) - 01:01, 6 October 2023
- Microscopy or Microanalysis is considered to include all techniques which employ a probe such as: photons (including x-rays), electrons, ions, mechanical...7 KB (969 words) - 21:49, 28 August 2024
- OCLC 247191522. Reimer, Ludwig (2013). Transmission Electron Microscopy : Physics of Image Formation and Microanalysis. Springer Berlin / Heidelberg. ISBN 978-3-662-13553-2...141 KB (15,534 words) - 19:06, 30 July 2024
- "Low-Voltage Electron Microscopy (LVEM) as a probe for solubilized membrane protein aggregation states". Microscopy and Microanalysis. 10 (2): 1492–1493...8 KB (1,045 words) - 22:13, 30 December 2023
- transitions of electrons in an excited atom. When an atom is probed by an external mechanism, such as a photon or a beam of electrons with energies in...31 KB (4,066 words) - 18:45, 18 August 2024
- the metal-semiconductor interface by ballistic electron emission microscopy". Microscopy Microanalysis Microstructures. 5: 31–40. doi:10.1051/mmm:019940050103100...3 KB (314 words) - 20:59, 29 April 2024
- Murfitt, M (2007). "Aberration-corrected Precession Electron Diffraction". Microscopy and Microanalysis. 13 (S02). doi:10.1017/S1431927607078555. S2CID 27057286...33 KB (4,334 words) - 23:08, 18 May 2024
- Henry J.; Joy, David C. (2018), "Backscattered Electrons", Scanning Electron Microscopy and X-Ray Microanalysis, New York, New York: Springer New York, pp...124 KB (13,682 words) - 20:39, 19 July 2024
- Lifshin. Scanning Electron Microscopy and X-Ray Microanalysis, 2nd Ed. Plenum Press, 1992. P. J. Goodhew and F. J. Humphreys. Electron Microscopy and Analysis