Jump to content

Fault grading

Add links
From Wikipedia, the free encyclopedia

This is an old revision of this page, as edited by Quinton Feldberg (talk | contribs) at 09:02, 11 August 2017 (fix citations). The present address (URL) is a permanent link to this revision, which may differ significantly from the current revision.

Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults.

It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained.[1]

See also

References

  1. ^ Kaeslin, Hubert (2008-04-28), Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication, Cambridge University Press, p. 24, ISBN 9780521882675
Retrieved from "https://en.wikipedia.org/w/index.php?title=Fault_grading&oldid=794991224"