Schlieren interferometer
It is proposed that this article be deleted because of the following concern:
If you can address this concern by improving, copyediting, sourcing, renaming, or merging the page, please edit this page and do so. You may remove this message if you improve the article or otherwise object to deletion for any reason. Although not required, you are encouraged to explain why you object to the deletion, either in your edit summary or on the talk page. If this template is removed, do not replace it. This message has remained in place for seven days, so the article may be deleted without further notice. Find sources: "Schlieren interferometer" – news · newspapers · books · scholar · JSTOR Nominator: Please consider notifying the author/project: {{subst:proposed deletion notify|Schlieren interferometer|concern=Essay or [[WP:OR|Original Research]]}} ~~~~ Timestamp: 20161127061642 06:16, 27 November 2016 (UTC) Administrators: delete |
The method thought by Focault and developed by Töpler implies that a single-pass Schilieren system can be converted into a single-beam Schilieren interferometer by replacing a knife-edge blade edge by a combination of Wollaston-prism-analyzer polarizer. In which some of the rays of light are diverted by the test section.[1] In practice, the capacitor forms from an S-source an image S 'which cuts with a knife. A lens is inserted between the screen and S 'gives an image of the test section. A part of the light rays passing through S at one point in the test section is intercepted by the knife while the other part A converges on the test screen [https://www.osapublishing.org/ao/viewmedia.cfm?uri=ao-11-4-858 1]
Description of the system
Relationship of stripe changes in the Interferogram with density changes.
Appropriate location of density difference.
Field of dynamic flow of complex gases, predictions.
Introduction
Schlieren Technique
If the brightness of the source is constant, the irradiation I is proportional to the beam of light that is stopped by the knife. When the beams do not deviate, section A does not change regardless of the point on the screen. The illumination is uniform and I proportional to S 'that emerges from the blade. When the optical thickness of the test section varies, the section A varies as a result of deviations from the light beams. The variation dI depends on θ x, because the illumination I is proportional to the part A. If b is the distance from the knife to the section yh the height of the section A in the absence of variation, it is shown that:
References:
Cite error: There are <ref group=https://www.osapublishing.org/ao/viewmedia.cfm?uri=ao-11-4-858>
tags on this page, but the references will not show without a {{reflist|group=https://www.osapublishing.org/ao/viewmedia.cfm?uri=ao-11-4-858}}
template (see the help page).