Feedback-controlled electromigration: Difference between revisions
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==Theory== |
==Theory== |
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[[Feedback Controlled Electromigration|FCE]] has been shown to be reversible demonstrating the fact that it is the electron's doing the moving rather then [[thermomigration]] or [[sublimation]]. The migration occurs due to the [[Ion wind|electronic wind force]] experienced by the metallic [[adatom]]. <ref name=Ishida1>{{cite journal | author = H.Ishida | title = Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111) | journal = Phys.Rev | volume = 89 | year = 2000 | month = September | doi = 10.1063/1.1325385 | url = http://link.aip.org/link/doi/10.1063/1.1325385 }}</ref> The electromigration occurs at a critical power dissipation <math>P=I/G</math> in the neck. <ref name=Strachan1>{{cite journal | author = D.R. Strachan et al. | title =Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy | journal = Nano Lett | volume = 6 | year = 2006 | url = http://pubs.acs.org/wls/journals/query/citationFindResults.html?op=findCitation&cit_qjrn=nalefd&vol=6&spn=441&mscid=&submit.x=24&submit.y=9&submit=FIND }}</ref> |
[[Feedback Controlled Electromigration|FCE]] has been shown to be reversible demonstrating the fact that it is the electron's doing the moving rather then [[thermomigration]] or [[sublimation]]. The migration occurs due to the [[Ion wind|electronic wind force]] experienced by the metallic [[adatom]]. <ref name=Ishida1>{{cite journal | author = H.Ishida | title = Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111) | journal = Phys.Rev | volume = 89 | year = 2000 | month = September | doi = 10.1063/1.1325385 | url = http://link.aip.org/link/doi/10.1063/1.1325385 }}</ref> The electromigration occurs at a critical power dissipation <math>P=I/G</math> in the neck of the bridge. <ref name=Strachan1>{{cite journal | author = D.R. Strachan et al. | title =Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy | journal = Nano Lett | volume = 6 | year = 2006 | url = http://pubs.acs.org/wls/journals/query/citationFindResults.html?op=findCitation&cit_qjrn=nalefd&vol=6&spn=441&mscid=&submit.x=24&submit.y=9&submit=FIND }}</ref> |
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==Uses== |
==Uses== |
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Revision as of 17:26, 4 November 2011
Feedback Controlled Electromigration is an experimental technique to investigate the phenomenon know as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration.
Theory
FCE has been shown to be reversible demonstrating the fact that it is the electron's doing the moving rather then thermomigration or sublimation. The migration occurs due to the electronic wind force experienced by the metallic adatom. [1] The electromigration occurs at a critical power dissipation in the neck of the bridge. [2]
Uses
FCE is often used in forming nanogaps in metallic bridges.
References and external links
- ^ H.Ishida (2000). "Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111)". Phys.Rev. 89. doi:10.1063/1.1325385.
{{cite journal}}: Unknown parameter|month=ignored (help) - ^ D.R. Strachan; et al. (2006). "Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy". Nano Lett. 6.
{{cite journal}}: Explicit use of et al. in:|author=(help)