Process control monitoring
This article does not cite any sources. (May 2008) (Learn how and when to remove this template message)
In the application of integrated circuits, process control monitoring (PCM) is the procedure followed to obtain detailed information about the process used.
PCM is associated with designing and fabricating special structures that can monitor technology specific parameters such as Vth in CMOS and Vbe in bipolars. These structures are placed across the wafer at specific locations along with the chip produced so that a closer look into the process variation is possible.
|This technology-related article is a stub. You can help Wikipedia by expanding it.|