Category:Metrology

I

• ► Instrument-making corporations‎ (69 P)

M

• ► Metric system‎ (4 C, 23 P)
• ► Metrologists‎ (17 P)

O

• ► Optical metrology‎ (10 C, 31 P)

S

• ► Standards (metrology)‎ (4 P)
• ► Standards organizations‎ (9 C, 40 P)

U

• ► Unified Code for Units of Measure‎ (2 C, 1 P)

• Historical metrology
• Metrology

A

• Absolute scale
• Accuracy and precision
• Airy points

B

• Biometrology
• Bundesamt für Eich- und Vermessungswesen
• Bya

C

• Calibration
• Centimetre–gram–second system of units
• CGS system of units
• Characterization of nanoparticles
• Convention of the Metre
• Conventional electrical unit
• Coordinate-measuring machine
• Cylindrical coordinate measuring machine

D

• Dalton (unit)
• Dimensional metrology

E

• Engineering tolerance

F

• Focus variation

H

• High-definition metrology

I

• Instrument error
• International prototype metre
• International Prototype of the Kilogram
• International System of Electrical and Magnetic Units
• ISO 16610
• ISO 25178

J

• Joint Committee for Guides in Metrology
• Josephson voltage standard

K

• Kendrick mass

L

• Laser scanning vibrometry
• Laser tracker
• Length measurement

M

• Magnetic flux quantum
• Mass-to-charge ratio
• Measured quantity
• Measurement
• Measuring instrument
• Metre
• Metre Convention
• Metrologia
• Mitutoyo
• Mobile metering
• Monoisotopic element
• Mononuclidic element

N

• Nanometrology
• National Institute of Metrology Standardization and Industrial Quality
• National Physical Laboratory (United Kingdom)
• Natural units
• NCSL International
• Norwegian Metrology Service
• Nucleogenic

O

• Open metering system
• Optical comparator
• Optical heterodyne detection
• Optical square

P

• Paris meridian
• Physical test
• Pratt & Whitney Measurement Systems
• Primary form
• Primordial nuclide
• Pseudoscientific metrology

Q

• Qiu Guangming
• Qualimetry

R

• Random-fuzzy variable
• Refractive index and extinction coefficient of thin film materials
• Repeatability
• Roundness (object)

S

• Scatterometer
• Sonomicrometry
• Sphericity
• Standard (metrology)
• Surface metrology

T

• Tesa
• Test method
• Treaty of the Meter
• Tresca section
• Troughton scale

U

• Unified Code for Units of Measure

V

• Virtual metrology