Talk:Electromigration
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I am trying to translate the german EM article the best I can. Feel free to correct the english in the text up to the message {{msg:inuse}}. It is quite difficult because it is very technical. I have done only a few technical translations from german to english. I prefer reading english text on EM not doing any translations at all :-) --Paddyez 11:54, 28 Apr 2004 (UTC)
is the first image´s alt tag: "failure through degradation of material" correct? --Paddyez 17:39, 28 Apr 2004 (UTC)
Wow...Deutsch...you are definitely smarter than me. I added the WD example -- my coworker (former WD employee) told me about that one. Basically, a bunch of drives using a particular controller board came back to WD under warranty fulfillment -- widespread failures across multiple production runs, but all within a 15-18 month window. When the WD engineers decapped the (third-party) failed microcontroller, and put it under a microscope, a first-year EE student could see the electromigration damage all over the die. The supplier confirmed the defective part and replaced all of them, not that it helped WD very much.
Formulas need citation
This Wikipedia entry is of little use to scholars and students, if they don't know where to look up the formulas presented. I cannot cite "Wikipedia article" as the source in my documents.
Does anyone know what Jim Black's middle name was? He died in 2004. DFH 16:37, 28 July 2006 (UTC)