User:Dixiedigger88/Books/Archaeometry

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Archaeometry[edit]

Materials Science Methods for Arcaeological Science Applications[edit]

background: Archaeological science; Archaeology; Conservation science; Materials science
methods: Scientific technique; List of materials analysis methods; X-ray fluorescence; Neutron activation analysis; Scanning electron microscope; Laser-induced breakdown spectroscopy; Absorption spectroscopy; Acoustic paramagnetic resonance; Anomalous X-ray scattering; Atom probe; Atomic absorption spectroscopy; Atomic emission spectroscopy; Atomic force microscopy; Attenuated total reflectance; Auger effect; Auger electron spectroscopy; Automated mineralogy; BET theory; Cathodoluminescence; Chemical ionization; Coherent diffraction imaging; Collision-induced dissociation; Confocal laser scanning microscopy; Conventional transmission electron microscope; Cryofixation; Cyclotron resonance; Dielectric thermal analysis; Differential dynamic microscopy; Differential scanning calorimetry; Differential thermal analysis; DNA-encoded chemical library; Dynamic light scattering; Dynamic mechanical analysis; Electron backscatter diffraction; Electron beam-induced current; Electron energy loss spectroscopy; Electron ionization; Electron microprobe; Electron microscope; Electron paramagnetic resonance; Electrophoretic light scattering; Energy-dispersive X-ray spectroscopy; Environmental scanning electron microscope; Extended X-ray absorption fine structure; Fiber analysis; Field emission microscopy; Field ion microscope; Fluorescence correlation spectroscopy; Focused ion beam; Four-terminal sensing; Fourier transform spectroscopy; Gas analysis; Gas chromatography; Gaseous detection device; Grazing incidence diffraction; Grazing-incidence small-angle scattering; Helium atom scattering; High resolution electron energy loss spectroscopy; High-performance liquid chromatography; High-resolution transmission electron microscopy; High-throughput screening; Inductively coupled plasma atomic emission spectroscopy; Inelastic electron tunneling spectroscopy; Ion cyclotron resonance; Isothermal titration calorimetry; Isotope dilution; Job plot; Length measurement; Low-voltage electron microscope; Low-energy electron diffraction; Low-energy electron microscopy; Low-energy ion scattering; Magic angle spinning; Magnetic susceptibility; Mass spectrometry; Monolithic HPLC column; Mössbauer spectroscopy; Multiangle light scattering; Muon spin spectroscopy; Nuclear magnetic resonance; Nuclear magnetic resonance crystallography; Nuclear resonance vibrational spectroscopy; Osmometer; Particle-induced X-ray emission; Photoconductive atomic force microscopy; Photonic force microscope; Porosimetry; QEMSCAN; Reflectance difference spectroscopy; Reststrahlen effect; Rutherford backscattering spectrometry; Sarfus; Scanning confocal electron microscopy; Scanning joule expansion microscopy; Single-molecule FRET; Solid-state nuclear magnetic resonance; Spin echo; Spin-polarized electron energy loss spectroscopy; Thermomechanical analysis; Total internal reflection fluorescence microscope; Transmission electron microscopy; Transmission electron microscopy DNA sequencing; Two-dimensional correlation analysis; Ultraviolet photoelectron spectroscopy; Ultraviolet–visible spectroscopy; Wavelength-dispersive X-ray spectroscopy; Weisz-Prater Criterion; X-ray crystal truncation rod; X-ray photoelectron spectroscopy; X-ray telescope; XANES