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curprev 18:4518:45, 24 June 2024‎ Boleyn talk contribs‎ 2,221 bytes −3‎ has ref undo

curprev 22:0122:01, 18 March 2024‎ Boleyn talk contribs‎ 1,990 bytes +28‎ No edit summary undo
curprev 13:0913:09, 18 March 2024‎ AnomieBOT talk contribs‎ m 1,962 bytes +16‎ Dating maintenance tags: {{Unreferenced}} undo
curprev 12:4812:48, 18 March 2024‎ Piotrus talk contribs‎ 1,946 bytes +17‎ {{unreferenced}} undo Tag: 2017 wikitext editor

curprev 18:4018:40, 16 November 2023‎ Alex O'Donnell talk contribs‎ 1,929 bytes +429‎ Add information about product development stage. undo

curprev 11:4311:43, 13 August 2023‎ 108.77.253.70 talk‎ 1,500 bytes −1‎ Labeled was misspelled (labelled). undo

curprev 02:1202:12, 18 November 2013‎ Wavelength talk contribs‎ 1,298 bytes 0‎ removing 1 hyphen: —> "newly assembled"—WP:HYPHEN, sub-subsection 3, point 4 undo

curprev 18:4818:48, 16 November 2013‎ DavidCary talk contribs‎ 1,298 bytes +4‎ link to article that goes into more detail, etc. undo

curprev 19:2419:24, 27 June 2011‎ Nabla talk contribs‎ 1,355 bytes +54‎ some wikilinks undo
curprev 19:1819:18, 27 June 2011‎ Nabla talk contribs‎ 1,301 bytes +41‎ styub sort undo
curprev 11:2811:28, 27 June 2011‎ DMahalko talk contribs‎ 1,260 bytes +148‎ add an example image - test points on a USB memory key undo
curprev 11:2311:23, 27 June 2011‎ DMahalko talk contribs‎ 1,112 bytes +1,112‎ Create article discussing test points in electronic devices. I'll look around for some Commons images to flesh this out.