Talk:Focused ion beam: Difference between revisions
m Maintain {{WPBS}}: 4 WikiProject templates. Keep majority rating "C" in {{WPBS}}. Remove 4 same ratings as {{WPBS}} in {{WikiProject Physics}}, {{WikiProject Technology}}, {{WikiProject Engineering}}, {{WikiProject Materials}}. Tag: |
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No one runs around saying, "oh, drat, ef-ai-bee source needs reheated, and I was almost done welding, dang it." It's "fib." --[[Special:Contributions/2600:387:6:80D:0:0:0:C3|2600:387:6:80D:0:0:0:C3]] ([[User talk:2600:387:6:80D:0:0:0:C3|talk]]) 12:08, 31 March 2017 (UTC) |
No one runs around saying, "oh, drat, ef-ai-bee source needs reheated, and I was almost done welding, dang it." It's "fib." --[[Special:Contributions/2600:387:6:80D:0:0:0:C3|2600:387:6:80D:0:0:0:C3]] ([[User talk:2600:387:6:80D:0:0:0:C3|talk]]) 12:08, 31 March 2017 (UTC) |
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== Clarification with a practical explanation == |
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This article, and probably all articles in areas of high precision miccroscopy (and the common extension of machines' probing mechanism to energies that enable nanolithography), requires something unheard of: an explanation that would enable someone who possesses a now quite common, if hand wavy and qualitative, technical understanding that would enable them to "picture" things in their mind. For example, from my own experience I know that many instruments incorporate 6-DOF "stages" to manipulate samples into arbitrary orientations relative to the detectors or probe sources. such "sample stages," which can be either physically very small (like TEM slides) or very large (like the chucks used for wafers in commercial scale multi 10 million dollar systems). Its an annoying thing, because the scientists and engineers who learn to use this type of technology are, initially at least, no less confused and lacking in practical understand as the general population and in many cases have their confusion about "HOW EVEN DOES THIS WORK?" and yet tend not to provide the same information when they later are in a position to do technical writing. Its a form of educational chauvanism that I hate, and counter as often as I can. I have written very simple explanations for TEM, AFM, NMR, various IR/optical/UV spectroscopy, and chromatographic instrumentation in dozens of different websites/communities/forums that are intended to explain "how" a particular technology is actually used in real life and almsot every single time people thank me for the "direct" explanations[[Special:Contributions/67.165.122.133|67.165.122.133]] ([[User talk:67.165.122.133|talk]]) 07:32, 3 March 2024 (UTC) |
Latest revision as of 07:32, 3 March 2024
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[edit]The article has almost no information about FIB as a sample preparation technique - just a little note that is used for TEM/SEM sample preparation. It should be developed and expanded including FIB for sample preparation for TEM and SEM I think. Volkeey (talk) 14:29, 1 March 2013 (UTC)
I'm not sure there's such a thing as an Ar+ FIB; you may be thinking of the argon ion mill, which is not a FIB. As such, I'm removing the bit about argon in the article. If I'm wrong, please link to a source about Ar+ FIB and replace the argon bit in the article. Cm the p 20:07, 14 July 2006 (UTC)
why does it everywhere say "an fib setup" .. isn't it "a fib setup"?! — Preceding unsigned comment added by 134.34.143.16 (talk) 11:56, 8 December 2011 (UTC)
- It is simple: an "ef-ai-bee", same as an "el-ee-dee" (an LED). Materialscientist (talk) 11:59, 8 December 2011 (UTC)
No one runs around saying, "oh, drat, ef-ai-bee source needs reheated, and I was almost done welding, dang it." It's "fib." --2600:387:6:80D:0:0:0:C3 (talk) 12:08, 31 March 2017 (UTC)
Clarification with a practical explanation
[edit]This article, and probably all articles in areas of high precision miccroscopy (and the common extension of machines' probing mechanism to energies that enable nanolithography), requires something unheard of: an explanation that would enable someone who possesses a now quite common, if hand wavy and qualitative, technical understanding that would enable them to "picture" things in their mind. For example, from my own experience I know that many instruments incorporate 6-DOF "stages" to manipulate samples into arbitrary orientations relative to the detectors or probe sources. such "sample stages," which can be either physically very small (like TEM slides) or very large (like the chucks used for wafers in commercial scale multi 10 million dollar systems). Its an annoying thing, because the scientists and engineers who learn to use this type of technology are, initially at least, no less confused and lacking in practical understand as the general population and in many cases have their confusion about "HOW EVEN DOES THIS WORK?" and yet tend not to provide the same information when they later are in a position to do technical writing. Its a form of educational chauvanism that I hate, and counter as often as I can. I have written very simple explanations for TEM, AFM, NMR, various IR/optical/UV spectroscopy, and chromatographic instrumentation in dozens of different websites/communities/forums that are intended to explain "how" a particular technology is actually used in real life and almsot every single time people thank me for the "direct" explanations67.165.122.133 (talk) 07:32, 3 March 2024 (UTC)
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